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VLSI Design and Test
Paperback
€130.49
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- Book Synopsis
- This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7-9, 2025. The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.
- Product Details
-
- ISBN
- 9783032263049
- Format
- Paperback
- Publisher
- Springer, (19 July 2026)
- Number of Pages
- 574
- Language
- English
- Dimensions
- 235 x 155 mm
- Series:
- See all books in this series
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